Sequential maximum likelihood estimation for reflected Ornstein-Uhlenbeck processes

نویسندگان

  • Chihoon Lee
  • Jaya P. N. Bishwal
  • Myung Hee Lee
چکیده

The paper studies the properties of a sequential maximum likelihood estimator of the drift parameter in a one dimensional reflected Ornstein-Uhlenbeck process. We observe the process until the observed Fisher information reaches a specified precision level. We derive the explicit formulas for the sequential estimator and its mean squared error. The estimator is shown to be unbiased and uniformly normally distributed. A simulation study is conducted to assess the performance of the estimator compared with the ordinary maximum likelihood estimator.

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تاریخ انتشار 2011